Design for Testability
Elexon Electronics’ Design for Testability (DFT) process aims to develop an optimum test strategy which ensures that an effective and efficient test routine is in place prior to commencement of full-scale production. The early detection of any potential issues relating to component and process defects is also an objective of this process.
Many factors affect the selection of the optimum set of test methodologies, including the product group/technology, product volume, product life, reliability requirements, development cost and pay back. Our highly skilled engineering team will assist you with the determination of the most appropriate test methodologies for any product.
We can provide you with the following selection of test methodologies:
In Circuit Testing (ICT): defects in signal interconnections and component placement identified using ICT test equipment, Flying Probe, MDA testers and/or boundary scan technology, as well as on-board chip programming capability;
Automated Optical Inspection (AOI): A high resolution AOI system with line-scan technology can check for presence, absence, shift/skew, misalignment, tombstone, reverse polarity, bridging, insufficient solder and more;
Visual testing: various product conformance criteria can be determined visually using tools such as magnification, cameras and templates;
Functional testing: sub-circuit and complete design integrity verified using manual, semi-manual and fully automated functional testing equipment;
Integration testing: designed to ensure that products interface with one another in a fully configured system using a range of manual and automated procedures;
Environmental testing: aims to determine a product’s operational limits through either an active or passive test under cycling or static environmental conditions.
Having assembled products to the highest quality standards, Elexon Electronics has proven expertise to undertake testing in simulated operating environments to determine the ability of any finished product to perform to its design specifications.